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Download Thermal Testing of Integrated Circuits ePub

by J. Altet,Antonio Rubio

Download Thermal Testing of Integrated Circuits ePub
  • ISBN 1402070764
  • ISBN13 978-1402070761
  • Language English
  • Author J. Altet,Antonio Rubio
  • Publisher Springer; 2002 edition (June 30, 2002)
  • Pages 204
  • Formats txt azw mobi lit
  • Category Engineering
  • Subcategory Engineering
  • Size ePub 1398 kb
  • Size Fb2 1448 kb
  • Rating: 4.2
  • Votes: 248

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.


Read instantly in your browser. by J. Altet (Author), Antonio Rubio (Author).

Read instantly in your browser. ISBN-13: 978-1441952875.

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Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They work at extremely low voltages and switch at very high frequencies. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality.

Автор: Altet . Rubio Antonio Название: Thermal Testing of Integrated Circuits ISBN: 1402070764 ISBN-13(EAN) . CMOS and BICMOS temperature sensors for built-in thermal testing are presented in the book.

Описание: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. The application of temperature as testing magnitude for both on-line and off-line, analog or digital, on-chip or off-chip are considered.

by J. Altet and Antonio Rubio. Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology

by J. Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology.

A44 It offers a multidisciplinary focus on thermal testing. Engineering oriented book on testing of devices This book proposes a new modeling technique for the purpose of test generation for digital logic circuit. The techniques can be applied either to the packaging of the components, or directly to the components themselves. Ambler, M. Abadir and S. Sastry, Economics of design and test, Ellis Horwood Limited, 1992. Engineering oriented book on testing of devices. M. A. Breuer and . Friedman, Diagnosis and reliable design of digital systems, Computer Science Press, 1976. D5B73 This book proposes a new modeling technique for the purpose of test generation for digital logic circuit.

Today’s electronic technology is based on the design and manufacture of integrated circuits. Excessive power during test affects the reliability of digital integrated circuits, test throughput and manufacturing yield. The concept of the integrated circuit comes from the work of 2000 Nobel Prize winner . Its origins can be dated to February 1959. Numerous low power test methods have been investigated over the past decade and new power-aware automatic test pattern generation, design-for-test and test planning techniques have emerged.

Thermal coupling in integrated circuits: application to thermal testing. J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys. Quiescent current sensor circuits in digital VLSI CMOS testing. A Rubio, J Figueras, J Segura. Electronics Letters 26 (15), 1204-1206, 1990. IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001. Dynamic surface temperature measurements in ICs. J Altet, W Claeys, S Dilhaire, A Rubio. Proceedings of the IEEE 94 (8), 1519-1533, 2006. Rubio Antonio Название: Thermal Testing of. .3. Thermal Analysis in Integrated Circuits. Описание: The main subject of this book is circuit design of silicon optoelectronic integrated circuits (OEICs).

3. 4. Temperature as a Test Observable Variable in IC's. 5. Thermal Monitoring of IC's.

Josep Altet, Antonio Rubio. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art. show more.