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Download Ion Beam Surface Layer Analysis: Volume 1 ePub

by Otto Meyer

Download Ion Beam Surface Layer Analysis: Volume 1 ePub
  • ISBN 0306350459
  • ISBN13 978-0306350450
  • Language English
  • Author Otto Meyer
  • Publisher Springer; 1st Printing. edition (May 1, 1976)
  • Pages 494
  • Formats docx lit txt mbr
  • Category Math
  • Subcategory Physics
  • Size ePub 1526 kb
  • Size Fb2 1329 kb
  • Rating: 4.6
  • Votes: 129

The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids" at Amsterdam, the Nether­ lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no­ vel applications. The increasing interest in this field was docu­ mented by 7 invited papers and 85 contributions which were presen­ ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses­ sions on "Fundamental Aspects", "Analytical Problems" and "Appli­ cations" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established.

The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids". ISBN 978-1-4615-8876-4. Versehen mit digitalem Wasserzeichen, DRM-frei. Erhältliche Formate: PDF.

The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no- vel applications. The increasing interest in this field was docu- mented by 7 invited papers and 85 contributions which were presen- ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications. The increasing interest in this field was docu mented by 7 invited papers and 85 contributions which were presen ted at the meeting in Karlsruhe to about 150 participants from 21 countries.

The date fell between two related con- ferences: "Application of Ion-Beams to Materials" at Warwick, Eng- land and "Atomic Collisions in Solids" at Amsterdam, the Nether- lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973.

Автор: Otto Meyer Название: Ion Beam Surface Layer Analysis Издательство: Springer .

The book is also useful for nuclear physics, chemistry and engineering scientists, scholars and graduate students interested in neutron-induced gamma ray spectroscopy and nuclear analytical methods.

Ion Beam Surface Layer Analysis: Volume 1 (Softcover Reprint of the Origi). Springer Us, Springer. Assembled Product Dimensions (L x W x H). 1. 0 x . 5 Inches.

found that the ion beam treatment would cause grain fragmentation of the . the near-surface layer. enhancement of volume diffusion in elastic strain fields and pulsed irradiation-induced temperature increase.

found that the ion beam treatment would cause grain fragmentation of the near-surface layer to a depth 5÷50 ȝm; a higher. extent of fragmentation was observed in grains whose close-packed planes were oriented approximately in the same. The goal of the given study is investigation of the regular features of fragmented structure. formation in the near-surface layer of NiTi alloy due to the action of silicon ion beam. Of particular interest are also.

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