The chapter describes the basic principles of the field ion (FIM) and field desorption (FDM) microscopies and of the probe-hole spectroscopic analysis of imaging species, as well as their applications for the studying of dynamic surface processes on the atomic scale
The chapter describes the basic principles of the field ion (FIM) and field desorption (FDM) microscopies and of the probe-hole spectroscopic analysis of imaging species, as well as their applications for the studying of dynamic surface processes on the atomic scale. Although the field ion microscopy is the oldest technique resolving individual atoms, it remains preeminent in their ability to prepare the atomically perfect surfaces and to persuade the dynamic surface processes such as catalytic reactions on the nanoscale using the parallel imaging principle.
American Elsevier Publishing Company, 1969 - Field ion microscope - 314 pages. Bibliographic information. Field Ion Microscopy: Principles and Applications. From inside the book. Fundamentals of Field Ion Microscopy.
Müller, Erwin W. Publication date. Field ion microscopes. Books for People with Print Disabilities. Trent University Library Donation.
Field Ion Microscopy. Principles and Applications. Erwin W. Müller and Tien Tzou Tsong. Elsevier, New York, 1969.
FIMS historically originates from Field Ion Microscopy, a field that was founded by . This led to the coupling of FI to a mass spectrometer and thus to the beginning of FIMS as reported in three seminal publications (3–5). Field-induced emission is an extremely large and spread mechanism, exploited in various techniques and applications such as electron field emission, transmission electron microscopy (TEM), or liquid metal ion source for scanning electron microscopy coupled with focused ion beam (SEM-FIB). Much of the source physics was established long ago when FIM was being developed by Müller and coworkers.
Field Ion Microscopy Principles and Applications. Scitation is the online home of leading journals and conference proceedings from AIP Publishing and AIP Member Societies. Elsevier, New York (1969) 2. Hren, . Ranganathan, S. (ed. : Field-Ion Microscopy. Plenum Press, New York (1968) 3. Bowkett, . Field-Ion Microscopy.
The Field ion microscope (FIM) was invented by Müller in 1951. It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. On October 11, 1955, Erwin Müller and his P. student, Kanwar Bahadur (Pennsylvania State University) observed individual tungsten atoms on the surface of a sharply pointed tungsten tip by cooling it to 21 K and employing helium as the imaging gas. Müller & Bahadur were the first persons to observe individual atoms directly.
Field Ion Microscopy by Muller, . Tsong, . We take great pride in accurately describing the condition of our books and . Field ion microscopy;: Principles and applications, Erwin W Mu?ller. Published by American Elsevier Pub. We take great pride in accurately describing the condition of our books and media, ship within 48 hours, and offer a 100% money back guarantee. Seller Inventory mon0000063972.
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